Nvidia Interview Questions, Process, and Tips

Contains cognitive and logical reasoning questions

Q1. Prepare digital electronics, architecture well
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Q1. Just introduction
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Q1. Motherboard, graphic cards, video cables and troubleshooting questions. About the company as well
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Q1. Total 5 rounds were taken. 1 + 4 hours (back to back rounds). Questions were based on edt configuration and how changing it wil affect my design in terms of coverage and pattern count. How we can debug ser...read more
Ans. 
Edt configuration: Having more chains will cause less pattern compaction. IF you want to get data for a particular chain u have to send more patterns (Imagine at compressor you want to get data you have to mask all the other chains in the xor gate) hence more patterns needed. If we have single scan cell in a chain then less fault will be covered (only 2 patterns 1 and 0 can be sent). If high number of scan cells are th...read more
Answered by patteringshinchan
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Q2. Atspeed clock mechanisms. Questions on fault types. Circuit was drawn and I was asked to cover maximum faults for minimum number of patterns (3,5 i/p xor gate was drawn and how I can get s@ 1 s@0 faults fo...read more
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Q3. Can hold time/setup violation occur at stuckat capture.
Ans. 
Yes, hold time/setup violation can occur at stuckat capture.
• Stuck-at faults can cause hold time violations if the data is not held long enough for the capture register to sample it.

• Similarly, setup violations can occur if the data is not stable before the capture register samples it.

• These violations can be avoided by proper timing constraints and clocking strategies.

• For example, adding a delay to the clock signal can e...read more
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Q4. Why can there be any coverage loss for 100% scan design.
Ans. 
Coverage loss can occur due to test pattern compression, test pattern generation, and test application issues.
• Test pattern compression can cause loss of coverage due to the reduction in the number of test patterns.

• Test pattern generation can result in coverage loss if the generated patterns do not cover all the faults.

• Test application issues such as timing violations or signal integrity problems can also lead to covera...read more
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Q5. Questions on issues faced during ATPG, GLS coverage analysis.
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Q6. Difference between T3 and T5 violation.
Ans. 
T3 and T5 violations are related to timing constraints in digital circuits.
• T3 violation occurs when the data arrives too late at the destination register.

• T5 violation occurs when the data arrives too early at the destination register.

• T3 and T5 violations can cause setup and hold time violations.

• T3 and T5 violations can be fixed by adjusting the timing constraints or by adding delay elements.

• Examples of T3 and T5 violat...read more
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Q1. Work related discussion session.
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Q1. Pick one question from 3 given questions and complete it in 7 days. I opted for creating traingle with opengl using shader.
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Data structures and algorithms
Problem were from leetcode and geek for geeks.

Q1. Data structures and algorithms
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Q1. Design and algorithms
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Coding round , questions from leetcode

Situation based questions and thought process

Q1. Managerial round 1, culture fit, behaviour
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Q2. Managerial round 2, innovative things done previously, how to face criticism, does experience matters in learning from subordinate
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Round duration - 60 Minutes
Round difficulty - Easy

The interviewer asked to tell me about myself and then asked some questions to solve like some questions on Lists, Strings and Numbers like comparing 2 strings, performing some operations on lists etc.

Q1. 
Check Word Presence in String
Given a string S and a list wordList containing N distinct words, determine if each word in wordList is present in S. Return a boolean array where the value at index 'i' indi...read more
Ans. 
Given a string and a list of words, determine if each word in the list is present in the string and return a boolean array indicating their presence.
• Iterate through each word in the word list and check if it is present in the string.

• Use a boolean array to store the presence of each word in the string.

• Remember that the presence of a word is case sensitive.

• Do not use built-in string-matching methods.

• Return the boolean ar
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Round duration - 20 Minutes
Round difficulty - Easy

When we entered to the aptitude test , we feel that it's tooo easy but practically it's too hard to crack the test . Ex: I wrote aptitude test ,there is only 15 Questions and they give time 50min .Then I completed the test 48min . So it's hard but easy also .

Q1. Bee the Resume perfect. Technical round as we know totally programming r subject related Questions are asked . So if we have subject knowledge on that , it's easy to crack it
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Q2. What is Unique key,What are some common clauses used with SELECT query in SQL?
Ans. 
Unique key is a column or set of columns that uniquely identifies each row in a table. Common SELECT clauses include WHERE, ORDER BY, and GROUP BY.
• A unique key is used to ensure data integrity and prevent duplicate rows.

• SELECT WHERE clause is used to filter data based on a condition.

• SELECT ORDER BY clause is used to sort data in ascending or descending order.

• SELECT GROUP BY clause is used to group data based on a colum
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Related society r education r companies r other factors

Q1. Personal and package and agriment and selection
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