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Digital design problems involve challenges in designing and implementing digital circuits and systems.
Understanding and optimizing power consumption
Ensuring signal integrity and minimizing noise
Implementing efficient clocking strategies
Addressing timing issues and meeting performance requirements
There are 3 patterns to detect faults on an XOR gate.
There are 3 possible fault patterns on an XOR gate: Stuck-At-0, Stuck-At-1, and Inversion.
Stuck-At-0 fault pattern occurs when one input is always 0, regardless of the other input.
Stuck-At-1 fault pattern occurs when one input is always 1, regardless of the other input.
Inversion fault pattern occurs when the output is inverted compared to the correct XOR gate output.
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