Intel Metrology Engineer Interview Questions and Answers

Electron microscope has limitations due to its high vacuum requirement and sample preparation needs.

• High vacuum requirement limits the types of samples that can be observed

• Sample preparation can be time-consuming and may alter the sample's natural state

• Electron beam can damage or destroy delicate samples

• Resolution is limited by the wavelength of the electrons

• Cannot observe living organisms

• Expensive equipment and mainte

Single crystal material can be imaged in TEM by preparing a thin sample and using electron diffraction.

• Prepare a thin sample of the single crystal material using a focused ion beam or mechanical polishing

• Load the sample onto a TEM grid and insert it into the TEM

• Use electron diffraction to obtain a diffraction pattern of the crystal lattice

• Rotate the sample to obtain different diffraction patterns and reconstruct the cr