Metrology Engineer Interview Questions and Answers

Single crystal material can be imaged in TEM by preparing a thin sample and using electron diffraction.

• Prepare a thin sample of the single crystal material using a focused ion beam or mechanical polishing

• Load the sample onto a TEM grid and insert it into the TEM

• Use electron diffraction to obtain a diffraction pattern of the crystal lattice

• Rotate the sample to obtain different diffraction patterns and reconstruct the crystal structure

The number of kaizen submitted in a month varies depending on the company's culture and practices.

• The number of kaizen submissions can range from a few to dozens in a month.

• Some companies may have a target number of kaizen submissions per month.

• Kaizen submissions can be related to process improvements, cost savings, or quality enhancements.

• Regular kaizen events or workshops can lead to a higher number of submissions in a month.

Electron microscope has limitations due to its high vacuum requirement and sample preparation needs.

• High vacuum requirement limits the types of samples that can be observed

• Sample preparation can be time-consuming and may alter the sample's natural state

• Electron beam can damage or destroy delicate samples

• Resolution is limited by the wavelength of the electrons

• Cannot observe living organisms

• Expensive equipment and maintenance costs