KLA
Interview Questions and Answers
Q1. 1. Find the smallestMissingNumber in given array using Bitwise OR operation alone 2. Based on Array data Manipulation.
Using Bitwise OR operation to find the smallest missing number in an array.
Iterate through the array and perform Bitwise OR operation with each element to set corresponding bit in a bitmask
Iterate through the bitmask to find the first unset bit, which represents the smallest missing number
Example: Array [0, 1, 3, 4, 6] would have a bitmask of 10101, smallest missing number is 2
Q2. How do prepare for testing without requirements.
Prepare by gathering information from stakeholders, exploring the application, creating test scenarios, and using exploratory testing.
Gather information from stakeholders to understand the purpose of the application.
Explore the application to identify key functionalities and potential areas of risk.
Create test scenarios based on the observed behavior and potential user interactions.
Use exploratory testing to uncover defects and validate the application's behavior.
Collaborate ...read more
Q3. Write a Pseudo code for given scenario?
Pseudo code for a scenario
Define variables and data structures needed
Write the main logic using conditional statements and loops
Handle edge cases and error conditions
Test the pseudo code with sample inputs
Q4. Write test cases for scenario, bug life cycle, etc
Writing test cases for scenario and bug life cycle
Create test cases to cover all possible scenarios in the application
Include positive and negative test cases to ensure thorough testing
Document bug life cycle stages such as New, Assigned, In Progress, Resolved, Closed
Verify bug fixes and retest to ensure they are resolved properly
Q5. Draw flow diagram of Wafer Test cases
Flow diagram of Wafer Test cases
Start with wafer preparation
Perform electrical testing on each die
Check for defects and record results
Sort dies based on test results
End with final wafer disposition
Q6. Write Test cases
Test cases should cover various scenarios to ensure software quality.
Test case for positive scenario
Test case for negative scenario
Test case for boundary value testing
Test case for error handling
Test case for performance testing
Q7. How to identify the source of contamination in a tool?
Q8. SEM explain working method etc
SEM stands for Scanning Electron Microscope, a type of microscope that uses electrons to create high-resolution images of samples.
SEM uses a focused beam of electrons to scan the surface of a sample
The electrons interact with the atoms in the sample, producing signals that can be used to create an image
SEM provides high-resolution images with magnifications up to 1,000,000x
It is commonly used in materials science, biology, and nanotechnology
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